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BE Electronics Engineering छमाही २ (इंजीनियरिंग) - University of Mumbai Important Questions for Applied Physics 2

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Applied Physics 2
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an electron is accelerated through a potential difference of 5kv and enters a uniform magnetic field of 0.02 wb/m2 acting normal to the direction of electron motion. Determine radius of the path. 

Appears in 1 question paper
Chapter: [11] Charge Particle in Electric and Magnetic Fields
Concept: Motion of Electron in Electric Field

An electron is accelerated through a potential difference of 18 kV in a colour TV cathode ray tube. Calculate the kinetic energy and speed of electron.

Appears in 1 question paper
Chapter: [11] Charge Particle in Electric and Magnetic Fields
Concept: Cathode Ray Tube (Crt)

Explain the concept of electrostatic focusing in electron impacts. 

Appears in 1 question paper
Chapter: [11] Charge Particle in Electric and Magnetic Fields
Concept: Electrostatic Focusing

An electron is accelerated through a potential difference of 5 kV and enters a uniform magnetic field of 0.02 `(wb)/(m^2)` acting normal to the direction of electron motion.
Determine the radius of path. 

Appears in 1 question paper
Chapter: [11] Charge Particle in Electric and Magnetic Fields
Concept: Motion of Electron in Magnetic Field

Draw the block diagram of cathode ray tube and briefly explain its parts. 

 

Appears in 1 question paper
Chapter: [11] Charge Particle in Electric and Magnetic Fields
Concept: Cathode Ray Tube (Crt)

Explain how A.C voltage and its frequency is measured using CRO.

Appears in 1 question paper
Chapter: [11] Charge Particle in Electric and Magnetic Fields
Concept: Application of Cro

Write a note on electrostatic focusing.

Appears in 1 question paper
Chapter: [11] Charge Particle in Electric and Magnetic Fields
Concept: Electrostatic Focusing

How is Lissajous figures used to measure unknown frequency?

Appears in 1 question paper
Chapter: [11] Charge Particle in Electric and Magnetic Fields
Concept: Application of Cro > Frequency

Derive Bethe’s Law for electron refraction.

Appears in 1 question paper
Chapter: [11] Charge Particle in Electric and Magnetic Fields
Concept: Electron Refraction

An electron enters a uniform magnetic field B=0.23x10-2 Wb/m2 at 450 angle to B. Determine the radius and pitch of helical path. Assume electron speed to be 3x107 m/s.

Appears in 1 question paper
Chapter: [11] Charge Particle in Electric and Magnetic Fields
Concept: Motion of Electron in Electric Field

With neat diagram explain construction and working of atomic force microscope. 

Appears in 1 question paper
Chapter: [12] Nanoscience and Nanotechnology
Concept: Important Tools in Nanotechnology > Atomic Force Microscope

What are the different techniques to synthesise nanomaterial? Explain one of them in detail.

Appears in 1 question paper
Chapter: [12] Nanoscience and Nanotechnology
Concept: Nano Materials > Methods to Synthesize Nanomaterials

What are different techniques to synthesis nanomaterial?
Explain one of them in detail. 

Appears in 1 question paper
Chapter: [12] Nanoscience and Nanotechnology
Concept: Nano Materials > Methods to Synthesize Nanomaterials

With neat diagram explain construction and working of scanning electron microscope. 

Appears in 1 question paper
Chapter: [12] Nanoscience and Nanotechnology
Concept: Important Tools in Nanotechnology > Scanning Electron Microscope

Explain construction and working of atomic force microscope.

Appears in 1 question paper
Chapter: [12] Nanoscience and Nanotechnology
Concept: Important Tools in Nanotechnology > Atomic Force Microscope

Explain different types of carbon nanotubes and give its applications.

Appears in 1 question paper
Chapter: [12] Nanoscience and Nanotechnology
Concept: Nano Materials > Properties and Applications of Nanomaterials

What is difference between Bottom up and Top Down Approach with respect to Nanotechnology.

Appears in 1 question paper
Chapter: [12] Nanoscience and Nanotechnology
Concept: Two Main Approaches in Nanotechnology

With a neat diagram explain the construction and working of scanning electron microscope.

Appears in 1 question paper
Chapter: [12] Nanoscience and Nanotechnology
Concept: Important Tools in Nanotechnology > Scanning Electron Microscope
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